Symbiosis International University

Your cart is empty.

Cart
Lists
Public lists SLSN New Arrival Book February 2018 New Arrival June- August 2025 New Arrivals March to May 2025 New Arrivals August & September 2024 New Arrivals -2024 New Arrival - SSE - July 2024 New Arrival - SSE - Feb 2024 New Arrivals April - August 2023 SMCW-Rack-30-Paediatric SMCW-Rack No-5-Anatomy View all
Your lists Log in to create your own lists

Log in to your account
Search history
Clear

Advanced search
Authority search
Recent comments
Tag cloud
Most popular
Purchase suggestions
Libraries

Log in to your account

Login: Password:

Forgot your password?

Home
ISBD view

Normal view MARC view ISBD view

Java / J2EE Testing Patterns

Jon Thomas

Java / J2EE Testing Patterns - New Delhi Wily Publishing Inc. 2004 - xv, 400, 8

ISBN: 9788126505555

Print
Add to your cart (remove)
Suggest for purchase
Save record
BIBTEX Dublin Core MARCXML MARC (non-Unicode/MARC-8) MARC (Unicode/UTF-8) MARC (Unicode/UTF-8, Standard) MODS (XML) RIS
More searches

Search for this title in:
Other Libraries (WorldCat) Other Databases (Google Scholar) Online Stores (Bookfinder.com)

Exporting to Dublin Core...

Simple DC-RDF
OAI-DC
SRW-DC