Transmission electron microscopy Part 1 : Basics
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TextPublication details: New York Springer 2009Edition: 2/eDescription: lxii,193 (I1-15) pbkISBN: - 9780387765013
- 620.11299/
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Symbiosis Institute of Technology, Lavale hill base, Pune Reference | 620.11299/WIL (Browse shelf(Opens below)) | Available | 38 | SIT-B-14882 | |
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Symbiosis Institute of Technology, Lavale hill base, Pune General Stacks | 620.11299/WIL (Browse shelf(Opens below)) | Available | 38 | SIT-B-14886 |
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| 620.1126/ AND Fracture mechanics : fundamentals and applications | 620.11296/CHE Chemistry, physics, and materials science of thermoelectric materials: beyond bismuth telluride | 620.11297/NEW New materials for thermoelectric applications : | 620.11299/WIL Transmission electron microscopy Part 1 : Basics | 620.11299/WIL Transmission electron microscopy Part 2 : Diffraction | 620.11299/WIL Transmission electron microscopy Part 3 : imaging | 620.11299/WIL Transmission electron microscopy Part 4 : spectrometry |
Previous ed.: New York: Plenum, 1996.
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